ESD in Silicon Integrated Circuits

In the seven years since the first edition of this book was completed, Electrostatic Discharge (ESD) phenomena in integrated circuits (IC) continues to be important as technologies shrink and the speed and size of the chips increases. The phenomena related to ESD events in semiconductor devices take place outside the realm of normal device operation. Hence, the physics governing this behavior are not typically found in general textbooks on semiconductors. Similarly the circuit design issues involve nonstandard approaches that are not covered in general books on electronic design. There has been a large amount of work done in the areas of ESD circuit design and the physics involved, most of which has been published in a number of papers and conference proceedings. This book covers the stateof-the-art in circuit design for ESD prevention as well as the device physics, test methods, and characterization. We also include case studies showing examples of approaches to solving ESD design problems.

Từ khóa: Integrated Circuits, circuit design, electronic design, thiết kế mạch, mạch tích hợp, thiết kế điện tử